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Title: A study of semiconductor-insulator interfaces using the three level charge pumping technique.
Author: Kivi, Michael John.
ISNI:       0000 0001 3600 6568
Awarding Body: University of Liverpool
Current Institution: University of Liverpool
Date of Award: 1996
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No abstract available
Supervisor: Not available Sponsor: Not available
Qualification Name: Thesis (Ph.D.) Qualification Level: Doctoral
EThOS ID:  DOI: Not available
Keywords: Hot carrier degradation