Use this URL to cite or link to this record in EThOS:
Title: Fault diagnosis and design for testability applied to analogue integrated circuits.
Author: Ho, Chung Kin.
ISNI:       0000 0001 3579 2798
Awarding Body: University of Bath
Current Institution: University of Bath
Date of Award: 1998
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No abstract available
Supervisor: Not available Sponsor: Not available
Qualification Name: Thesis (Ph.D.) Qualification Level: Doctoral
EThOS ID:  DOI: Not available
Keywords: Circuits