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Title: Transient response testing of linear components within mixed-signal systems.
Author: Evans, Peter Sidney Albert.
ISNI:       0000 0001 3454 0177
Awarding Body: University of Huddersfield
Current Institution: University of Huddersfield
Date of Award: 1994
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No abstract available
Supervisor: Not available Sponsor: Not available
Qualification Name: Thesis (Ph.D.) Qualification Level: Doctoral
EThOS ID:  DOI: Not available
Keywords: Integrated circuit defects