Use this URL to cite or link to this record in EThOS: http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.728552
Title: An analysis of atomic manipulation, intermolecular resolution and the artefacts of dynamic force microscopy
Author: Lekkas, I.
ISNI:       0000 0004 6494 3219
Awarding Body: University of Nottingham
Current Institution: University of Nottingham
Date of Award: 2017
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Abstract:
In this thesis we go through a journey of atomic manipulation of Pb dimers on Si(100), then we examine the limitations of AFM in inter- molecular resolution and we take a closer look at a very promising technique named simultaneous STM/AFM which opens new horizons in the field but is part of an ongoing debate as it is still under development. NC-AFM imaging of adsorbed Pb dimers on Si(100) provided detailed information of the Pb configuration, which agrees with previous STM studies. The lateral force required to move a Pb dimer is related to the adsorption of the dimer on the surface, the associated potential energy land scape and in some cases the interaction of the Pb dimer with its neighbouring dimers. In the next part of this thesis, we examine the adsorption of a small organic molecule (NTCDI) on Si(111)-(7×7) and we report two energetically preferable geometries among others. In the last part of this thesis, we present an analysis of the crosstalk effect using an Omicron commercial qPlus sensor and a home built sensor with two system configurations and we compare them with a Createc commercial system. The results show that in order to avoid crosstalk the range of the STM operational pre-amplifier and the optimal elec- tronics wiring play a major role.
Supervisor: Not available Sponsor: Not available
Qualification Name: Thesis (Ph.D.) Qualification Level: Doctoral
EThOS ID: uk.bl.ethos.728552  DOI: Not available
Keywords: QC170 Atomic physics. Constitution and properties of matter ; QH201 Microscopy
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