Use this URL to cite or link to this record in EThOS: http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.709226
Title: Scanning Kelvin probe microscopy studies on device physics of organic field-effect transistors
Author: Hu, Yuanyuan
ISNI:       0000 0004 6057 0099
Awarding Body: University of Cambridge
Current Institution: University of Cambridge
Date of Award: 2015
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Abstract:
No abstract available
Supervisor: Not available Sponsor: Not available
Qualification Name: Thesis (Ph.D.) Qualification Level: Doctoral
EThOS ID: uk.bl.ethos.709226  DOI: Not available
Keywords: Scanning probe microscopy ; Field-effect transistors
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