Use this URL to cite or link to this record in EThOS: http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.684330
Title: High-fidelity entanglement of trapped ions using long-wavelength radiation
Author: Randall, Joseph Aidan Delf
ISNI:       0000 0004 5920 8666
Awarding Body: Imperial College London
Current Institution: Imperial College London
Date of Award: 2015
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Abstract:
This thesis describes experimental work in which the spin and motional states of one and two trapped atomic ions are manipulated with long-wavelength radiation in the microwave and radio frequency (RF) regime. This allows single- and two-qubit quantum logic gates to be implemented with long-wavelength radiation, in contrast to laser frequency radiation used in the majority of work to date. The two-qubit gate scheme developed represents a significant advance towards a large scale quantum computing architecture in which laser light is not needed for coherent manipulation. An experimental setup is built in which a macroscopic linear Paul trap is fitted with permanent magnets to create a strong axial magnetic field gradient. This addition allows the spin and motional states of the ions to be coupled using long-wavelength radiation. The coherence time of qubits that are sensitive to the magnetic field gradient is increased by nearly three orders of magnitude with the use of dressed states and the lifetime and coherence time are measured to be T1 = 0.63(4) s and T2 = 0.65(5) s, respectively. Using the dressed-state qubit, sideband cooling of a single ion to the motional ground state is demonstrated, and the final mean phonon number after cooling is measured to be \bar{n} = 0.13(4). Finally, a two-qubit gate is demonstrated using the dressed-state qubits in conjunction with the magnetic field gradient, and a Bell state fidelity of F = 0.985(12) is determined. This is a significant increase in fidelity for a two-qubit gate based on long-wavelength radiation compared to previous work. The errors are analysed and it is shown that with the next generation of microfabricated traps being developed in the group, the gate fidelity using this scheme can be pushed far into the fault tolerant regime. This makes this scheme promising as an integral part of a large scale quantum computing architecture.
Supervisor: Kim, Myungshik Sponsor: Engineering and Physical Sciences Research Council
Qualification Name: Thesis (Ph.D.) Qualification Level: Doctoral
EThOS ID: uk.bl.ethos.684330  DOI: Not available
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