Use this URL to cite or link to this record in EThOS: http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.681985
Title: Development and characterisation of a confocal Raman microspectrometer
Author: Dahlan, Ahmad M.
Awarding Body: University of Manchester
Current Institution: University of Manchester
Date of Award: 2000
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Abstract:
This thesis describes optimisation and characterisation of confocal Raman microspectrometer in the laboratory, and its application on several materials of technological importance. Optimisation in scanning improved the repeatability of scanning from –lOum to –2um. The lateral and depth resolutions of the optimised system were approximately 1um and 5um respectively. The depth resolution of the current system was approximately 40% worse than in commercial instruments. A theoretical model has been proposed to describe the confocal operation of the optical system. To the best of the author’s knowledge, the model has not been published elsewhere. The model was found useful in determining optimum combination of pinhole size and auxiliary lens in the confocal Raman system. For the first time, the optimised confocal Raman microspectrometer was used to study polymethylmethacrylate/polystyrene(PMMA/PS) copolymer film. It was found that PMMA component exists in the form of spheres of various sizes on PS matrix layer, and this is first direct confirmation of results of previous studies that investigated fluorophore-labelled PMMA/PS copolymer. Studies on annealed proton-exchanged lithium niobate(APE LN) revealed that there is a correlation between refractive index profiles and intensity ratios of low-frequency Raman peaks, but the exact nature of the relationship could not be determined due to time limitation. Nevertheless, the study showed that changes in intensity ratios of the low-frequency Raman peaks could be used to describe the refractive index profiles.
Supervisor: Kvasnik, Frank Sponsor: Not available
Qualification Name: Thesis (Ph.D.) Qualification Level: Doctoral
EThOS ID: uk.bl.ethos.681985  DOI: Not available
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