Use this URL to cite or link to this record in EThOS: http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.669987
Title: Electron diffraction analysis of amorphous Ge2Sb2Te5
Author: Chen, Yixin
Awarding Body: University of Oxford
Current Institution: University of Oxford
Date of Award: 2010
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Abstract:
No abstract available
Supervisor: Cockayne, D. J. H. Sponsor: Not available
Qualification Name: Thesis (Ph.D.) Qualification Level: Doctoral
EThOS ID: uk.bl.ethos.669987  DOI: Not available
Keywords: Electrons--Diffraction ; Texture (Crystallography) ; Amorphous semiconductors
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