Use this URL to cite or link to this record in EThOS: http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.658792
Title: The influence of scatter and beam hardening in X-ray computed tomography for dimensional metrology
Author: Lifton, Joseph J.
ISNI:       0000 0004 5355 9684
Awarding Body: University of Southampton
Current Institution: University of Southampton
Date of Award: 2015
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Abstract:
This thesis is concerned with the use of X-ray computed tomography (CT) for making dimensional measurements. Scattered radiation and beam hardening are two phenomena that are well-known to severely degrade the quality of cone-beam CT data; however, the impact they have on dimensional measurements is not well understood. The aim of this work is to better understand how scatter and beam hardening influence dimensional measurements. The influence that scattered radiation and beam hardening have on internal and external dimensional measurements is investigated for two surface determination methods: the ISO50 method and a local gradient-based method. The work includes both experiment and simulation. The influence of scatter is assessed through the use of source collimation and the beam stop array scatter correction method, whilst the influence of beam hardening is assessed using spectrum pre-filtration. The simulation makes use of empirically derived X-ray spectra and scatter signals; good agreement between measured and simulated data is seen. The results show the presence of scatter and beam hardening decreases the measured size of internal features and increases the measured size of external features. This effect is seen for both surface determination methods, with the local method being more robust for outer features. The ISO50 surface determination method fails to give the ‘correct’ surface position for both inner and outer features in the presence of scatter and/or beam hardening. For the local surface determination method, scatter and beam hardening change the turning point of the edge gradient, this being the property by which surface points are defined for the local method; it is therefore through this change in turning point that scatter and beam hardening influence dimensional measurements.
Supervisor: Mcbride, John Sponsor: Not available
Qualification Name: Thesis (Ph.D.) Qualification Level: Doctoral
EThOS ID: uk.bl.ethos.658792  DOI: Not available
Keywords: TJ Mechanical engineering and machinery ; TK Electrical engineering. Electronics Nuclear engineering
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