Use this URL to cite or link to this record in EThOS:
Title: An approach for addressing challenges and quality robustness in test engineering for semiconductor manufacture
Author: Vock, Stefan R.
ISNI:       0000 0004 5348 5371
Awarding Body: Ulster University
Current Institution: Ulster University
Date of Award: 2015
Availability of Full Text:
Access from EThOS:
No abstract available
Supervisor: Not available Sponsor: Not available
Qualification Name: Thesis (Ph.D.) Qualification Level: Doctoral
EThOS ID:  DOI: Not available