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Title: Structural and electronic properties of metal oxides
Author: Regoutz, Anna
ISNI:       0000 0004 5354 9013
Awarding Body: University of Oxford
Current Institution: University of Oxford
Date of Award: 2014
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Metal oxides are of immense technological importance. Their wide variety of structural and electronic characteristics leads to a flexibility unrivalled by other groups of materials. However, there is still much debate about the fundamental properties of some of the most widely used oxides, including TiO2 and In2O3. This work presents high quality, in-depth characterisation of these two oxides in pure and doped form, including soft and hard X-ray photoelectron spectroscopy and X-ray diffraction. Bulk samples as well as thin film samples were prepared analysed. For the preparation of thin films a high quality sol-gel dip-coating method was developed, which resulted in epitaxial films. In more detail the organisation of the thesis is as follows: Chapter 1 provides an introduction to key ideas related to metal oxides and presents the metal oxides investigated in this thesis, In2O3, Ga2O3, Tl2O3, TiO2, and SnO2. Chapter 2 presents background information and Chapter 3 gives the practical details of the experimental techniques employed. Chapters 4 presents reciprocal space maps of MBE-grown In2O3 thin films and nanorods on YSZ substrates. Chapters 5 and 6 investigate the doping of In2O3 bulk samples with gallium and thallium and introduce a range of solid state characterisation techniques. Chapter 7 describes the development of a dip-coating sol-gel method for the growth of thin films of TiO2 and shows 3D reciprocal space maps of the resulting films. Chapter 8 concerns hard x-ray photoelectron spectroscopy of undoped and Sn-doped TiO2. Chapter 9 interconnects previous chapters by presenting 2D reciprocal space maps of nano structured epitaxial samples of In2O3 grown by the newly developed sol-gel based method. Chapter 10 concludes this thesis with a summary of the results.
Supervisor: Egdell, Russell Sponsor: Not available
Qualification Name: Thesis (Ph.D.) Qualification Level: Doctoral
EThOS ID:  DOI: Not available
Keywords: Solid state chemistry ; Chemistry & allied sciences ; Advanced materials ; Crystallography ; Inorganic chemistry ; Spectroscopy and molecular structure ; Structural chemistry ; Surface chemistry ; Surface analysis ; Atomic scale structure and properties ; Surfaces ; Condensed Matter Physics ; metal oxides ; transparent conducting oxides ; photocatalysis ; X-ray diffraction ; reciprocal space mapping ; X-ray photoelectron spectroscopy ; sol-gel