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Title: Atom diffractometry from nanostructured surfaces
Author: Huang, C.
Awarding Body: University of Cambridge
Current Institution: University of Cambridge
Date of Award: 2006
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Chapter 1 introduces the basic principles of atom diffractometry and scattering from surfaces. I discuss the experimental and theoretical methods employed to determine the atom-surface interaction potential. In addition, a brief description of the apparatus and typical measurements are given. In Chapter 2, a new method is developed for determining the atom-surface interaction potential by interference effects. Based on a 0.5 ML Ni-Cu(100) surface, the helium interaction potential on an unreconstructed Ni(100) overlayer is determined experimentally, which would not have been previously possible due to the absence of diffractive and resonant scattering intensity. A detailed investigation of growth mechanism and surface structure of Ni-Cu(100) is presented in Chapter 3. It is observed that the nickel growth occurs by forming ordered overlayer structures at and below room-temperature, whilst proceeds via alloying processes at high temperatures. The second growth system, Li-Cu(100), is studied in Chapter 4. A sequence of ordered overlayer structures with unusual electronic corrugations are observed in the growth at low temperatures. The surface corrugation for helium scattering from a complex structure, c(5V 2 x v 2)R45° Li-Cu (100), is derived through a diffraction analysis using the exact, close-coupled channels method. Finally, a comparison between neon and helium scattering from an ordered c(2x2) Li-Cu(100) structure is presented in Chapter 5. The surface corrugation for neon scattering is determined on a metallic overlayer for the first time. it is found that the neon corrugation amplitude is at least one order of magnitude larger than for helium. Such a difference exceeds those observed previously on low-index transition metal surfaces.
Supervisor: Not available Sponsor: Not available
Qualification Name: Thesis (Ph.D.) Qualification Level: Doctoral
EThOS ID:  DOI: Not available