Use this URL to cite or link to this record in EThOS: http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.603993
Title: Electromigration in metals and critical currents in high Tc superconductors
Author: Hibbs, Andrew Dennis
ISNI:       0000 0001 3555 8037
Awarding Body: University of Cambridge
Current Institution: University of Cambridge
Date of Award: 1989
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Abstract:
This thesis contains experimental and theoretical work on two highly important aspects of electric current flow in solids. In Part 1 electromigration in metals is discussed and observations of the nucleation and growth of voids in aluminium microcircuits reported. The importance of stress driven diffusional backflow is highlighted and shown to play an analogous role to work hardening during plastic flow. In the second half of Part 1, a new expression for the force exerted on the lattice ions by the electrons of a current carrying metal is derived. The analysis is shown to be applicable to the similar problem of electrical resistivity and the predicted values for both electromigration mass transport and resistivity compare favourably with other expressions in the literature, and with experiment. Part 2 contains results of magnetisation measurements on the high temperature superconductor YBa2Cu3O7. Many of the essential parameters have been measured including perhaps the first data for the pinning penetration depth and the interaction distance. The results are shown to imply that YBa2Cu3O7 contains weak links approximately 1μm apart.
Supervisor: Not available Sponsor: Not available
Qualification Name: Thesis (Ph.D.) Qualification Level: Doctoral
EThOS ID: uk.bl.ethos.603993  DOI: Not available
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