Use this URL to cite or link to this record in EThOS: http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.558441
Title: ATLAS FSI retroflectors and inner detector B-field calibration study
Author: Cox, Jonathan T. J.
Awarding Body: University of Oxford
Current Institution: University of Oxford
Date of Award: 2010
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Abstract:
The start of data taking at the Large Hadron Collider should make a new frontier in particle physics accessible for the first time. The ATLAS experiment has been designed to take advantage of this opportunity to complete the standard model, whilst having the maximum possible sensitivity to the new physics. The alignment accuracy of the Silicon tracking detectors will be vital if ATLAS is to contribute optimally to precision and discovery physics. In response to this difficult challenge, a novel laser alignment system that can precisely measure 842 lengths between grid nodes attached to the detector support structure has been developed. Each of the lengths is monitored remotely via interferometry and this thesis reports on the punched corner cube retroreflectors that form the end nodes of each interferometer grid line. The development of a process to successfully manufacture, and to ensure the finished quality of, approximately 700 retroreflectors is reported. Optical surface profileometry of retroreflector surfaces has been used to investigate the flatness and angles between reflecting faces. A detailed optical simulation has modelled the observed features in the diffraction patterns from a variety of real retroreflectors. Additionally a method to calibrate B-field scale factors, for the solenoid tracking volume, based on Z-boson decay products is reported. The algorithm is able to retrieve applied changes to the magnetic field in 7]-binned regions of the tracking volume. The stability of the calibration algorithm is tested for 50'000 Z ~ f.1+ 11- decays.
Supervisor: Nickerson, Richard Sponsor: Not available
Qualification Name: Thesis (Ph.D.) Qualification Level: Doctoral
EThOS ID: uk.bl.ethos.558441  DOI: Not available
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