Use this URL to cite or link to this record in EThOS: http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.515364
Title: Characterisation of Electron Traps in Gate Dielectrics for Flash Memory Applications
Author: Zheng, Xuefeng
Awarding Body: Liverpool John Moores University
Current Institution: Liverpool John Moores University
Date of Award: 2009
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Abstract:
No abstract available
Supervisor: Not available Sponsor: Not available
Qualification Name: Thesis (Ph.D.) Qualification Level: Doctoral
EThOS ID: uk.bl.ethos.515364  DOI: Not available
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