Use this URL to cite or link to this record in EThOS: http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.471928
Title: Defect properties of bulk and thin film PbTe
Author: Sealy, B. J.
ISNI:       0000 0001 2448 6031
Awarding Body: University of Surrey
Current Institution: University of Surrey
Date of Award: 1972
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Abstract:
The properties of the lead ohaloogenide group of semiconductors and more specifically of PbTe, have been investigated in order to predict, and control the growth of thin epitaxial films for use as thin film field effect transistors. The thermodynamic properties of binary compounds has been analysed in detail and used to explain the defect properties of PbTe and PbSe. The calculated pressure-temperature-composition (or P-T-x) phase diagram for PbTe was compared with "as grown" and annealed epitaxial film properties (grown on mica substrates) to discover whether films obeyed bulk thermodynamics. "As grown" films appear to be metastable, i.e. their composition, estimated from electrical properties, suggests that they lie outside the phase boundary at the substrate temperatures employed (200-300°C). Changes occur on annealing in vacuo which suggest that the films tend toward the thermodynamic equilibrium state represented, by the calculated bulk P-T-x phase diagram. An investigation of the electrical properties of ternary solid solutions of group IX elements with PbTe and PbSe has been carried out in the hope of producing an improved semiconductor material compared with PbTe and PbSe. A correlation of electrical properties with film structure, obtained from replication and transmission elctron microscopy, was attempted producing a number of useful and interesting conclusions.
Supervisor: Not available Sponsor: Not available
Qualification Name: Thesis (Ph.D.) Qualification Level: Doctoral
EThOS ID: uk.bl.ethos.471928  DOI: Not available
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