Use this URL to cite or link to this record in EThOS: http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.471459
Title: Transmission electron microscopy of defects in silicon.
Author: Salisbury, I. G.
Awarding Body: University of Birmingham
Current Institution: University of Birmingham
Date of Award: 1978
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Abstract:
No abstract available
Supervisor: Not available Sponsor: Not available
Qualification Name: Thesis (Ph.D.) Qualification Level: Doctoral
EThOS ID: uk.bl.ethos.471459  DOI: Not available
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