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Title: Electron trapping in gate dielectrics and NBTI of MOSFETs
Author: Chang, Mo Huai
Awarding Body: Liverpool John Moores University
Current Institution: Liverpool John Moores University
Date of Award: 2006
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No abstract available
Supervisor: Not available Sponsor: Not available
Qualification Name: Thesis (Ph.D.) Qualification Level: Doctoral
EThOS ID:  DOI: Not available
Keywords: TK Electrical engineering. Electronics. Nuclear engineering