Use this URL to cite or link to this record in EThOS: http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.430284
Title: Built-in self-test of analogue circuits using optimised fault sets and transient response testing
Author: Axelos, Nicholas.
ISNI:       0000 0001 3433 7187
Awarding Body: University of Huddersfield
Current Institution: University of Huddersfield
Date of Award: 2005
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Abstract:
No abstract available
Supervisor: Not available Sponsor: Not available
Qualification Name: Thesis (Ph.D.) Qualification Level: Doctoral
EThOS ID: uk.bl.ethos.430284  DOI: Not available
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