Use this URL to cite or link to this record in EThOS:
Title: Improved atomic force microscopy based techniques for electrical and structural characterisation of thin dielectric films
Author: Frammelsberger, Werner.
ISNI:       0000 0001 3481 1440
Awarding Body: University of the West of England, Bristol,
Current Institution: University of the West of England, Bristol
Date of Award: 2006
Availability of Full Text:
Access through EThOS:
No abstract available
Supervisor: Not available Sponsor: Not available
Qualification Name: Thesis (Ph.D.) Qualification Level: Doctoral
EThOS ID:  DOI: Not available