Use this URL to cite or link to this record in EThOS: http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.392325
Title: Measurements of excess avalanche noise in sub-micron Si and Al[subscript 0.6]Ga[subscript 0.4]As avalanche photodiodes
Author: Tan, Chee Hing
Awarding Body: University of Sheffield
Current Institution: University of Sheffield
Date of Award: 2002
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Abstract:
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Supervisor: Not available Sponsor: Not available
Qualification Name: Thesis (Ph.D.) Qualification Level: Doctoral
EThOS ID: uk.bl.ethos.392325  DOI: Not available
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