Use this URL to cite or link to this record in EThOS: http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.383250
Title: Surface and bulk traps in materials and devices for GaAs integrated circuits
Author: Blight, S. R.
Awarding Body: University of Wales Institute of Science and Technology (UWIST)
Current Institution: Cardiff University
Date of Award: 1987
Availability of Full Text:
Access through EThOS:
Abstract:
No abstract available
Supervisor: Not available Sponsor: Not available
Qualification Name: Thesis (Ph.D.) Qualification Level: Doctoral
EThOS ID: uk.bl.ethos.383250  DOI: Not available
Keywords: MESFETs trapping levels Electric apparatus and appliances Electronic apparatus and appliances Electric circuits Electronic circuits Solid state physics
Share: