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Title: The electron microscopy of silicon of sapphire materials.
Author: Paus, K.
Awarding Body: University of Oxford
Current Institution: University of Oxford
Date of Award: 1987
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No abstract available
Supervisor: Not available Sponsor: Not available
Qualification Name: Thesis (Ph.D.) Qualification Level: Doctoral
EThOS ID:  DOI: Not available
Keywords: Thin film layer analysis Solid state physics Atoms Molecules