Use this URL to cite or link to this record in EThOS: http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.382189
Title: Silicon sublimation at ultra high vacuum with microprocessor monitoring and measurements
Author: Al-Rawi, S. A. N.
Awarding Body: University of Kent
Current Institution: University of Kent
Date of Award: 1988
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Abstract:
No abstract available
Supervisor: Not available Sponsor: Not available
Qualification Name: Thesis (Ph.D.) Qualification Level: Doctoral
EThOS ID: uk.bl.ethos.382189  DOI: Not available
Keywords: Thin film measurement Solid state physics Atoms Molecules Electric apparatus and appliances Electronic apparatus and appliances
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