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Title: Charge trapping instabilities in amorphous silicon/silicon nitride thin film transistors
Author: Hepburn, A. R.
Awarding Body: Council for National Academic Awards (CNAA)
Current Institution: Open University
Date of Award: 1988
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No abstract available
Supervisor: Not available Sponsor: Not available
Qualification Name: Thesis (Ph.D.) Qualification Level: Doctoral
EThOS ID:  DOI: Not available
Keywords: Semiconductor charge trapping Solid state physics Electric apparatus and appliances Electronic apparatus and appliances