Use this URL to cite or link to this record in EThOS: http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.379967
Title: Transmission electron microscopy of GaAs/AlGaAs multilayers.
Author: Hetherington, C.
Awarding Body: University of Oxford
Current Institution: University of Oxford
Date of Award: 1987
Availability of Full Text:
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Abstract:
No abstract available
Supervisor: Not available Sponsor: Not available
Qualification Name: Thesis (Ph.D.) Qualification Level: Doctoral
EThOS ID: uk.bl.ethos.379967  DOI: Not available
Keywords: Semiconductor layer deposits Solid state physics
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