Use this URL to cite or link to this record in EThOS: http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.369408
Title: The development of differential reflectance spectroscopy, and its application to the study of semiconductor surfaces.
Author: Lowe, David.
Awarding Body: University of Warwick
Current Institution: University of Warwick
Date of Award: 2000
Availability of Full Text:
Access through EThOS:
Abstract:
No abstract available
Supervisor: Not available Sponsor: Not available
Qualification Name: Thesis (Ph.D.) Qualification Level: Doctoral
EThOS ID: uk.bl.ethos.369408  DOI: Not available
Keywords: SURFACES; SPECTRAL REFLECTANCE; ELECTRONIC STRUCTURE; SPECTROMETERS; VISIBLE RADIATION; SEMICONDUCTOR MATERIALS Atoms Molecules Solid state physics
Share: