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Title: Single pattern detection and identification of of CMOS transistor faults, requirements and methods : design and realisation of the OCIMU I←D←D←Q monitor; single pattern CMOS transistor fault testing.
Author: Manhaeve, Hans A. R.
ISNI:       0000 0001 3618 046X
Awarding Body: University of Hull
Current Institution: University of Hull
Date of Award: 1996
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Supervisor: Not available Sponsor: Not available
Qualification Name: Thesis (Ph.D.) Qualification Level: Doctoral
EThOS ID:  DOI: Not available
Keywords: Components Electric apparatus and appliances Electronic apparatus and appliances