Use this URL to cite or link to this record in EThOS: http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.360613
Title: Charge density determination in semiconductors and other materials by electron diffraction.
Author: Burgess, W. George
Awarding Body: University of Cambridge
Current Institution: University of Cambridge
Date of Award: 1994
Availability of Full Text:
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Abstract:
No abstract available
Supervisor: Not available Sponsor: Not available
Qualification Name: Thesis (Ph.D.) Qualification Level: Doctoral
EThOS ID: uk.bl.ethos.360613  DOI: Not available
Keywords: Crystalline materials; Electrons; Bonding Solid state physics
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