Use this URL to cite or link to this record in EThOS: http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.354693
Title: Defects in irradiated MOS structures
Author: Vranch, Richard
Awarding Body: University of Cambridge
Current Institution: University of Cambridge
Date of Award: 1985
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Abstract:
No abstract available
Supervisor: Not available Sponsor: SERC ; Fulmer Research Institute
Qualification Name: Thesis (Ph.D.) Qualification Level: Doctoral
EThOS ID: uk.bl.ethos.354693  DOI: Not available
Keywords: Metal oxide semiconductor Solid state physics Nuclear physics
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