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Title: On-chip testing of very large scale integrated circuits.
Author: Varma, P.
Awarding Body: University of Manchester Institute of Science and Technology
Current Institution: University of Manchester
Date of Award: 1984
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No abstract available
Supervisor: Not available Sponsor: Not available
Qualification Name: Thesis (Ph.D.) Qualification Level: Doctoral
EThOS ID:  DOI: Not available
Keywords: Integrated circuit tests Electric apparatus and appliances Electronic apparatus and appliances