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Title: Modelling and analysis of failures in CMOS integrated cirucuits
Author: Johnson, Simon
Awarding Body: Durham University
Current Institution: Durham University
Date of Award: 1993
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No abstract available
Supervisor: Not available Sponsor: Not available
Qualification Name: Thesis (Ph.D.) Qualification Level: Doctoral
EThOS ID:  DOI: Not available
Keywords: Circuit failure Electric apparatus and appliances Electronic apparatus and appliances Electric circuits Electronic circuits