Use this URL to cite or link to this record in EThOS: http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.333110
Title: Characterisation of 3-4 quaternary multilayer semiconductor device materials by x-ray diffraction.
Author: Swaminathan, S.
Awarding Body: University of Warwick
Current Institution: University of Warwick
Date of Award: 1985
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Abstract:
No abstract available
Supervisor: Not available Sponsor: Not available
Qualification Name: Thesis (Ph.D.) Qualification Level: Doctoral
EThOS ID: uk.bl.ethos.333110  DOI: Not available
Keywords: Solid-state physics Solid state physics
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