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Title: Characterisation of 3-4 quaternary multilayer semiconductor device materials by x-ray diffraction.
Author: Swaminathan, S.
ISNI:       0000 0001 3493 124X
Awarding Body: University of Warwick
Current Institution: University of Warwick
Date of Award: 1985
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No abstract available
Supervisor: Not available Sponsor: Not available
Qualification Name: Thesis (Ph.D.) Qualification Level: Doctoral
EThOS ID:  DOI: Not available
Keywords: Solid-state physics