Use this URL to cite or link to this record in EThOS: http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.332145
Title: Computer controlled capacitance transients determination of defect centres in epitaxial silicon.
Author: Marshall, A.
Awarding Body: Trent Polytechnic
Current Institution: Nottingham Trent University
Date of Award: 1984
Availability of Full Text:
Full text unavailable from EThOS. Please contact the current institution's library directly if you wish to view the thesis.
Abstract:
No abstract available
Supervisor: Not available Sponsor: Not available
Qualification Name: Thesis (Ph.D.) Qualification Level: Doctoral
EThOS ID: uk.bl.ethos.332145  DOI: Not available
Keywords: Electronics and electrical engineering Electric engineering Computer science
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