Use this URL to cite or link to this record in EThOS: http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.329218
Title: Design of certain silicon semi-customised structures incorporating self-test.
Author: Taylor, David.
Awarding Body: Polytechnic, Huddersfield,
Current Institution: University of Huddersfield
Date of Award: 1989
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Abstract:
No abstract available
Supervisor: Not available Sponsor: Not available
Qualification Name: Thesis (Ph.D.) Qualification Level: Doctoral
EThOS ID: uk.bl.ethos.329218  DOI: Not available
Keywords: Electronic circuit testability Electric circuits Electronic circuits Electric apparatus and appliances Electronic apparatus and appliances Reliability (Engineering)
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