Use this URL to cite or link to this record in EThOS: http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.328404
Title: A study of failure locus of NPN transistors and its improvement using graded collector structures.
Author: Humphreys, M. J.
Awarding Body: University of Liverpool
Current Institution: University of Liverpool
Date of Award: 1988
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Abstract:
No abstract available
Supervisor: Not available Sponsor: Not available
Qualification Name: Thesis (Ph.D.) Qualification Level: Doctoral
EThOS ID: uk.bl.ethos.328404  DOI: Not available
Keywords: Bipolar transistor failure Electric apparatus and appliances Electronic apparatus and appliances
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