Use this URL to cite or link to this record in EThOS: http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.325924
Title: Electrical resistivity of thin metal films and multilayers.
Author: Fenn, Michael.
Awarding Body: University of Oxford
Current Institution: University of Oxford
Date of Award: 1999
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Abstract:
No abstract available
Supervisor: Not available Sponsor: Not available
Qualification Name: Thesis (Ph.D.) Qualification Level: Doctoral
EThOS ID: uk.bl.ethos.325924  DOI: Not available
Keywords: ELECTRIC CONDUCTIVITY; THIN FILMS; COPPER; NIOBIUM; ZIRCONIUM; LAYERS; GRAIN BOUNDARIES; REFLECTIVITY; GRAIN SIZE; MAGNETIC SUSCEPTIBILITY; DESIGN; TESTING; TEMPERATURE DEPENDENCE Solid state physics
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