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Title: Development and applications of FTIR reflectance spectroscopy for the characterisation of novel SIMOX structures.
Author: Hatzopoulos, Nikos.
ISNI:       0000 0001 3546 3193
Awarding Body: University of Surrey
Current Institution: University of Surrey
Date of Award: 1996
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No abstract available
Supervisor: Not available Sponsor: Not available
Qualification Name: Thesis (Ph.D.) Qualification Level: Doctoral
EThOS ID:  DOI: Not available
Keywords: SOI multilayer structures; Semiconductors