Use this URL to cite or link to this record in EThOS: http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.317955
Title: The development of secondary ion mass spectrometry for two-dimensional impurity profiling in semiconductors.
Author: Cooke, Graham Alan.
Awarding Body: University of Warwick
Current Institution: University of Warwick
Date of Award: 1992
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Abstract:
No abstract available
Supervisor: Not available Sponsor: Not available
Qualification Name: Thesis (Ph.D.) Qualification Level: Doctoral
EThOS ID: uk.bl.ethos.317955  DOI: Not available
Keywords: Nuclear physics & particle accelerators Nuclear physics Chemistry, Physical and theoretical Solid state physics
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