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Title: Design-for-Test and Built-In-Self-Test for integrated systems.
Author: Olbrich, Thomas.
Awarding Body: University of Lancaster
Current Institution: Lancaster University
Date of Award: 1996
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No abstract available
Supervisor: Not available Sponsor: Not available
Qualification Name: Thesis (Ph.D.) Qualification Level: Doctoral
EThOS ID:  DOI: Not available
Keywords: Miniturisation; Quality; MEMS; DfT; BIST Electric measurements Electronic measurements Electric apparatus and appliances Electronic apparatus and appliances