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Title: Atomic force microscopy : atomic resolution imaging and force-distance spectroscopy.
Author: Grimble, Ralph Ashley.
Awarding Body: University of Oxford
Current Institution: University of Oxford
Date of Award: 1999
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No abstract available
Supervisor: Not available Sponsor: Not available
Qualification Name: Thesis (Ph.D.) Qualification Level: Doctoral
EThOS ID:  DOI: Not available
Keywords: SCANNING TUNNELING MICROSCOPY; ATOMIC FORCE MICROSCOPY; PERFORMANCE TESTING; DESIGN; FABRICATION Optics Solid state physics Pattern recognition systems Pattern perception Image processing