Use this URL to cite or link to this record in EThOS: http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.312277
Title: Atomic force microscopy : atomic resolution imaging and force-distance spectroscopy.
Author: Grimble, Ralph Ashley.
Awarding Body: University of Oxford
Current Institution: University of Oxford
Date of Award: 1999
Availability of Full Text:
Full text unavailable from EThOS. Please contact the current institution's library directly if you wish to view the thesis.
Abstract:
No abstract available
Supervisor: Not available Sponsor: Not available
Qualification Name: Thesis (Ph.D.) Qualification Level: Doctoral
EThOS ID: uk.bl.ethos.312277  DOI: Not available
Keywords: SCANNING TUNNELING MICROSCOPY; ATOMIC FORCE MICROSCOPY; PERFORMANCE TESTING; DESIGN; FABRICATION Optics Solid state physics Pattern recognition systems Pattern perception Image processing
Share: