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Title: Transmission electron microscope structural studies of Si, SiGe and SiC materials and devices.
Author: Whitehurst, Jeremy.
Awarding Body: University of Oxford
Current Institution: University of Oxford
Date of Award: 1992
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No abstract available
Supervisor: Not available Sponsor: Not available
Qualification Name: Thesis (Ph.D.) Qualification Level: Doctoral
EThOS ID:  DOI: Not available
Keywords: Solid-state physics Solid state physics Electric apparatus and appliances Electronic apparatus and appliances