Use this URL to cite or link to this record in EThOS: http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.301415
Title: The structure and properties of interface regions in nanostructured Co/Si thin films.
Author: Fallon, Jason Michael.
Awarding Body: University of Salford
Current Institution: University of Salford
Date of Award: 1999
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Abstract:
No abstract available
Supervisor: Not available Sponsor: Not available
Qualification Name: Thesis (Ph.D.) Qualification Level: Doctoral
EThOS ID: uk.bl.ethos.301415  DOI: Not available
Keywords: COBALT; SILICON; FILMS; LAYERS; PHYSICAL PROPERTIES; MECHANICAL STRUCTURES Solid state physics Coatings Paint Metallurgy
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