Use this URL to cite or link to this record in EThOS: http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.301376
Title: Radiation effects on custom MOS devices.
Author: Harris, Rhodri.
ISNI:       0000 0001 2451 4434
Awarding Body: University of Southampton
Current Institution: University of Southampton
Date of Award: 1999
Availability of Full Text:
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Abstract:
No abstract available
Supervisor: Not available Sponsor: Not available
Qualification Name: Thesis (Ph.D.) Qualification Level: Doctoral
EThOS ID: uk.bl.ethos.301376  DOI: Not available
Keywords: MOS TRANSISTORS; PHYSICAL RADIATION EFFECTS; MOSFET; TESTING; RADIATION DOSES; DOSE-RESPONSE RELATIONSHIPS Electric apparatus and appliances Electronic apparatus and appliances Nuclear physics
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