Use this URL to cite or link to this record in EThOS: http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.301372
Title: Fault simulation for structural testing of analogue integrated circuits
Author: Spinks, Stephen James
ISNI:       0000 0001 3475 4124
Awarding Body: University of Hull
Current Institution: University of Hull
Date of Award: 1998
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Abstract:
In this thesis the ANTICS analogue fault simulation software is described which provides a statistical approach to fault simulation for accurate analogue IC test evaluation. The traditional figure of fault coverage is replaced by the average probability of fault detection. This is later refined by considering the probability of fault occurrence to generate a more realistic, weighted test metric. Two techniques to reduce the fault simulation time are described, both of which show large reductions in simulation time with little loss of accuracy. The final section of the thesis presents an accurate comparison of three test techniques and an evaluation of dynamic supply current monitoring. An increase in fault detection for dynamic supply current monitoring is obtained by removing the DC component of the supply current prior to measurement.
Supervisor: Not available Sponsor: Not available
Qualification Name: Thesis (Ph.D.) Qualification Level: Doctoral
EThOS ID: uk.bl.ethos.301372  DOI: Not available
Keywords: Electric apparatus and appliances ; Electronic apparatus and appliances ; Electric circuits ; Electronic circuits ; Computer software Electric apparatus and appliances Electronic apparatus and appliances Electric circuits Electronic circuits Computer software
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