Use this URL to cite or link to this record in EThOS: http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.298320
Title: A study of the electrical properties of defects in silicon.
Author: Blood, Arabella M.
Awarding Body: University of Oxford
Current Institution: University of Oxford
Date of Award: 1998
Availability of Full Text:
Full text unavailable from EThOS. Please contact the current institution's library directly if you wish to view the thesis.
Abstract:
No abstract available
Supervisor: Not available Sponsor: Not available
Qualification Name: Thesis (Ph.D.) Qualification Level: Doctoral
EThOS ID: uk.bl.ethos.298320  DOI: Not available
Keywords: ELECTRIC CONDUCTIVITY; SILICON; DEFECTS; CRYSTALS; RECOMBINATION Solid state physics
Share: