Use this URL to cite or link to this record in EThOS:
Title: Hierarchical testing of integrated circuits.
Author: Micallef, Steven P.
ISNI:       0000 0001 3396 965X
Awarding Body: University of Oxford
Current Institution: University of Oxford
Date of Award: 1991
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No abstract available
Supervisor: Not available Sponsor: Not available
Qualification Name: Thesis (Ph.D.) Qualification Level: Doctoral
EThOS ID:  DOI: Not available
Keywords: Components Electric apparatus and appliances Electronic apparatus and appliances Reliability (Engineering)