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Title: Yield modelling for large area integrated circuits.
Author: Bolouri, Hamid Shakourzadeh.
Awarding Body: Brunel University
Current Institution: Brunel University
Date of Award: 1990
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No abstract available
Supervisor: Not available Sponsor: Not available
Qualification Name: Thesis (Ph.D.) Qualification Level: Doctoral
EThOS ID:  DOI: Not available
Keywords: Components Electric apparatus and appliances Electronic apparatus and appliances Reliability (Engineering)