Use this URL to cite or link to this record in EThOS: http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.290180
Title: The study of defects in bismuth germanium oxide (Bi←1←2GeO←2←0) using phonon echoes and other techniques.
Author: Terry, Ian.
Awarding Body: University of Lancaster
Current Institution: Lancaster University
Date of Award: 1988
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Abstract:
No abstract available
Supervisor: Not available Sponsor: Not available
Qualification Name: Thesis (Ph.D.) Qualification Level: Doctoral
EThOS ID: uk.bl.ethos.290180  DOI: Not available
Keywords: Semiconductor defects Solid state physics
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