Use this URL to cite or link to this record in EThOS: http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.285916
Title: Electronic Speckle Pattern Interferometry : instruments development, optimisation and applications
Author: Albrecht, Daniel J. F.
Awarding Body: Loughborough University
Current Institution: Loughborough University
Date of Award: 1998
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Abstract:
Optical interferometric techniques are being increasingly used in industry. These non contact techniques, using laser methods based on speckle interferometry, assure a greater accuracy in measuring displacements caused by deformations. One such technique, Electronic Speckle Pattern Interferometry (ESPI), has been used successfully, by analysis of the reaction of mechanical components to induced mechanical or thermal stress, for the measurements of in-situ, real time, full-field, in-plane and out-of-plane displacements and the detection of detachments, micro-cracks occurring as internal and external defects.
Supervisor: Not available Sponsor: European Commission
Qualification Name: Thesis (Ph.D.) Qualification Level: Doctoral
EThOS ID: uk.bl.ethos.285916  DOI: Not available
Keywords: Fringe analysis; Optics; Coherence; NDT
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